Non-destructive and microanalytical techniques in art and cultural heritage
Welcome to the website of the international conference TECHNART 2011.
The aim of TECHNART 2011 is to provide a scientific forum to present and promote the use of analytical spectroscopy techniques in the field of cultural heritage. The conference builds on the momentum of TECHNART 2009 offering an outstanding and unique opportunity for exchanging knowledge on leading edge developments. Cultural heritage studies are interpreted in a broad sense, including pigments, stones, metals, glass, ceramics, chemometrics on artwork studies, resins, fibers, forensic applications in art history, archaeology and conservation science.
TECHNART 2011 is organised by BAM Federal Institute for Materials Research and Testing and will take place from 26 to 29 April 2011 in Berlin, Germany, at BAM Headquarters.
Conference topics
X-ray microanalysis (XRF, PIXE, XRD, SEM-EDX)
Confocal X-ray microscopy (3D Micro-XRF, 3D Micro-PIXE)
Synchrotron, ion beam and neutron based techniques/instrumentation
FT-IR and raman microscopy
UV-Vis and NIR absorption/reflectance and fluorescence
Laser-based analytical techniques
Magnetic resonance techniques
Chromatography (GC, HPLC) and mass spectrometry
Optical imaging and coherence techniques
Mobile spectrometry and remote sensing
http://www.technart2011.bam.de/en/home/index.htm
